Hitachi FT230 (XRF Coating thickness measurement

FT230 is a high-performance XRF coating thickness analyzer from Hitachi High-Tech for fast, non-destructive plating measurement. Featuring a large stage up to 900 mm, it is ideal for Semiconductor, Electronics, PCB, and Automotive applications.

Hitachi NEXTA DSC600

NEXTA DSC600 with Real View® technology provides high-sensitivity DSC analysis with real-time sample observation during measurement. Ideal for evaluating melting, crystallization, and material properties in R&D and quality control applications

SENSOFAR S-MART2

Sensofar S-mart2 is a 3D areal confocal optical sensor for non-contact surface measurement with sub-micron to nanometer resolution. It enables fast full-field (areal) inspection, ideal for semiconductor, electronics, and inline process control applications